Keithley 2622 WLR free download

File name 2622 WLR.pdf

Reliability "Bathtub Curve" A G R E AT E R M E A S U R E O F C O N F I D E N C E Failure Lifetime Rate Failure Area Time Figure 1. Typical semiconductor reliability curve. Stress-measure testing is a common tech- nique used to evaluate operating lifetimes Wafer Level Reliability and wear-out failure mechanisms in semi- conductor devices. This testing is focused on failures on the right side of the typical Testing